Determination of thickness of metal layers on wires and strips
SnLAYER for determination of thickness of metal layers | |
When coating metals, wafer-thin layers are often sufficient to achieve the necessary effect. At the same time, homogeneous thin layers should be achieved that fulfil the required electrical properties and stability over many years. A few additional micrometres mean an increased, useless consumption of valuable material and thus unnecessary costs.
With ECH's SnLAYER analysis system, the coating thickness on metals is determined quickly and with high precision with only one single measurement. For this purpose, a new electrochemical method was developed, which is based on coulometric voltammetry and is oriented towards the standards DIN 1787 and DIN 40500, Part 5. The patented potential scan method enables the simultaneous determination of free and alloyed parts of coatings, e.g. tin on copper.
A typical measurement takes less than five minutes.
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ECH Elektrochemie Halle GmbH
Otto-Eißfeldt-Straße 8
06120 Halle (Saale)
Germany
Tel.: +49 345 279570-0
Fax: +49 345 279570-99
Mail: info@ech.de
ECH Scientific Limited
Building 69, Wrest Park, Silsoe
Bedfordshire, MK45 4HS
United Kingdom
Tel.: +44 1525 404747
Fax: +44 1525 404848
Mail: info@echscientific.com