The thickness of the non-alloyed and alloyed tin
layer on thin copper wires can be measured with
high accuracy in a short duration by the
electrochemical Analyzer SnLayer.  The coulometric
determination of the thickness of the tin layer at
the copper wires based on a newly developed procedure:
the technique of voltammetry with a multiple potential
-ramp. The total amount of tin as well as the non-alloyed
and the alloyed tin-part is detectable in only one
measurement.